一个人在线观看免费高清电视剧,《课后2对1特别授课》女主角是..,女人大阴肩夹缝是阴虚还是阳虚,9.1国产NBA免费看电影

第三代
半导体测试家族
Third generation semiconductor testing family
首页 产品中心 Vision QuickView Visual Detection System
分类
 
Orientation Inspection Station

Designed and developed based on the needs of the semiconductor industry, using industrial cameras and industrial computers with stable operation, accurate digital transmission, rapid response, clear picture capture, complete and reliable



Suspended power supply

Multiple sites in parallel

Multi-channel high precision

Supports multiple extensions

Type Direction detection station
Description Designed and developed based on the needs of the semiconductor industry, using industrial cameras and industrial computers with stable operation, accurate digital transmission, rapid response, clear picture capture, complete and reliable.
It fully meets the production speed of the highest-speed Handler and has complete testing stations to meet various testing needs of customers. QV series inspection system, configurable inspection stations include: 3D inspection station, printing station, taping station, direction station, etc.
This system can be used with various Handlers, and the detection range covers various types of semiconductor devices, such as: SOT23, SOD123, SOD323, SOD523, SOD923, SMA, SMB, SMC, SOD882(1006), TO92, TO252, SOD129, MBS, SOP8L and other software The system provides Chinese and English interfaces, multi-level authority control, and a high degree of automation.
The software system is 100% linked and developed, and according to the machine vision inspection process, the combination is optimized and easy to operate and apply.
All parameters of industrial cameras, such as shutter time, gain, contrast, light source brightness, etc., can be adjusted through software.
The QV series machine vision identification system is used for various packaged devices in the semiconductor industry to conduct all-round, high-precision visual inspection of product pins and plastic packages, such as fonts, 2D pins, 3D pins, and plastic package surface defects.
Convenient application, simple operation, stable system operation, improving customers' production capacity.
Timely detect the accuracy of various devices in the semiconductor industry to improve production efficiency.
Perform calibration quickly, ensure zero defective rate, and improve production quality.
Function ? Detect the seal content on the surface of the device (typos, multiple characters, missing characters, defacement, offset, blurred reprint, scratches, cracked plastic package, etc.)
? Detect device pin information (direction, foot length, foot width, foot spacing, foot offset, etc.)
Basic Configuration CCD cameras, industrial lenses, LED light sources, mechanical structural parts
SI Detection The minimum area is 0.7mm*0.7mm, and the overall average grayscale difference is more than 40
GR&R <10%


Recommend推荐产品
外姓兄弟| 插翅难逃 电视剧| 《警花交换做爰》| 蓝牙且机怎幺恢复出厂设置| 聚茶乙塚望料| 15岁女初中生免费观看电视剧| 如似我闻的全部小说| 日本XXX| 尼克-杨| windows镜像下载网站| 波多野结衣 欧美| alcs6| 我的兄弟叫顺溜 | wlkmdk天赋及输出手法| 证券开户万一免五| 词语大全| 中央电视台1套节目表| 悟空外传详细攻略圈文| 日本中文字幕| 18岁的少女与狗高清电视剧| 九首歌电影在线观看完整版高清| 社闻可以欧出来吗| 刑警使命| 图卢兹足球俱乐部| 公式居中对齐,编号右对齐| 战斗天使阿丽塔| 夏胥释| 秋月奈久留| prefer 而不是| 海狼级核潜艇