第三代
半导体测试家族
Third generation semiconductor testing family
分类
QT-DRM101000 GaN Dynamic RDON
Suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution
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Hard handover <1us |
Supports resistive/ inductive loads |
Support hard/
soft handover |
Multiple-pulse output |
| Type | QT-DRM101000 |
| Advantages |
QT-DRM101000 is suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution |
| Main Features |
? Support FT or CP, laboratory, mass production testing ? Hard handover and soft handover, hard handover can meet the requirement of<1uS measurement RDON ? Output capacity 10A/1000V
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